Methods and systems for characterizing and identifying electronic devices

A system for characterizing an electronic device, comprising:

• a processor;
• memory coupled to the processor for storing a database;
• and
• a measurement subsystem configured to:
• determine a physical fingerprint of an electronic device comprising a static random access memory (SRAM) array, using selected memory cells of the SRAM array, wherein the physical fingerprint comprises data retention voltages respectfully corresponding to the selected memory cells;
• and
• storing data associated with the physical fingerprint in the database.

A system for identifying an electronic device, comprising:

• a processor;
• memory coupled to the processor for storing a database;
• a measurement subsystem configured to characterizing a test device comprising a static random access memory (SRAM) array, wherein selected memory cells of the SRAM array respectfully comprises data retention voltages corresponding to a physical fingerprint of the test device;
• and
• an analysis subsystem configured to compare the physical fingerprint with a predetermined fingerprint stored in the database to determine whether the physical fingerprint and the predetermined fingerprint are within-class or between-class, wherein the predetermined fingerprint is associated with a target device to be identified.