Location measurement apparatus and method
AssigneeElectronics and Telecommunications Research Institute
InventorsJae-Bok Park, Duk-Kyun Woo
Life of this patent
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AssigneeElectronics and Telecommunications Research Institute
InventorsJae-Bok Park, Duk-Kyun Woo
Estimating the term…
Disclosed herein are a location measurement method and apparatus. The apparatus includes a first grading unit, a first presumed line calculation unit, a second grading unit, a second presumed lined calculating unit, a presumed location calculation unit, and a final location calculation unit. The first grading unit determines the grade of a first RSSI. The first presumed line calculation unit calculates the range of the object from a first node based on the grade of the first RSSI. The second grading unit determines the grade of a second RSSI. The second presumed lined calculating unit calculates the range of the object from a second node based on the grade of the second RSSI. The presumed location calculation unit calculates two presumed locations. The final location calculation unit determines one of the two presumed locations to be the final location of the object.
A location measurement method, comprising:
A location measurement apparatus, comprising:
Dependencies are inferred from the claim text.