Specimen analyzing method and specimen analyzing apparatus
AssigneeSysmex Corporation
InventorsNorimasa YAMAMOTO, Takashi YAMATO, Naohiko MATSUO, Satoshi IGUCHI
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Abstract
A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
Claims20
A specimen analyzing method comprising steps of:
- sucking a specimen stored in a specimen container and sampling the specimen into a first container;
- optically measuring said specimen in said first container;
- sampling said specimen into a second container and preparing a measurement sample by mixing the specimen with a reagent in the second container;
- and
- analyzing said measurement sample according to a result of the optical measurement of said specimen.
A specimen analyzing apparatus comprising:
- a first sampling portion for sucking a specimen stored in a specimen container and sampling the specimen into a first container;
- an optical measurement portion for optically measuring said specimen sampled into said first container;
- a second sampling portion for sampling said specimen into a second container;
- a sample preparation portion for preparing a measurement sample by mixing the specimen with a reagent in said second container;
- an analysis portion for analyzing said measurement sample;
- and
- a control portion for controlling an analyzing operation by said analysis portion according to a result of the optical measurement of said specimen.
Dependencies are inferred from the claim text.