Substrate processing apparatus and substrate processing method
AssigneeTokyo Electron Limited
InventorsHisashi Kawano, Norihiro Ito, Yosuke Hachiya, Jun Nogami, Kotaro Ooishi, Itaru Kanno
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AssigneeTokyo Electron Limited
InventorsHisashi Kawano, Norihiro Ito, Yosuke Hachiya, Jun Nogami, Kotaro Ooishi, Itaru Kanno
Estimating the term…
The present disclosure provides a substrate processing apparatus including: a substrate processing chamber configured to process a substrate on which a target layer to be removed is formed on the surface of an underlying layer; a substrate holding unit provided in the substrate processing chamber and configured to hold the substrate; a mixed liquid supplying unit configured to supply a mixed liquid of sulfuric acid and hydrogen peroxide to the substrate held by the substrate holding unit in a mixing ratio of the hydrogen peroxide and a temperature that does not damage the underlying layer while removing the target layer; and an OH-group supplying unit configured to supply a fluid containing OH-group to the substrate in an amount that does not damage the underlying layer when the mixed liquid and the OH-group are mixed on the substrate.
A substrate processing apparatus comprising:
A substrate processing method comprising:
A non-transitory computer-readable storage medium for storing a computer program that, when executed, cause a computer to perform a substrate processing method, the substrate processing method comprising:
Dependencies are inferred from the claim text.