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US 2013/0340533 A1Published application
Strain gauge using two-dimensional materials
AssigneeMassachusetts Institute of Technology
InventorsMario Hofmann, Jing Kong
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Abstract
Strain gauge. The gauge includes a substrate and a thin film of overlapping, two-dimensional flakes deposited on the substrate. Structure responsive to conductance across the film is provided whereby a strain induced change in overlap area between neighboring flakes results in a change in conductance across the film. In a preferred embodiment, the two-dimensional flakes are graphene.
Claims10
Strain gauge comprising:
- a substrate;
- a thin film of overlapping, two-dimensional flakes deposited on the substrate;
- and
- structure responsive to conductance across the film, whereby a strain induced change in overlap area between neighboring flakes results in a change in conductance across the film.
1 more element
Dependencies are inferred from the claim text.