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US 2013/0340445 A1Published application
Efficient temperature forcing of semiconductor devices under test
AssigneeM.D. Mechanical Devices Ltd.
InventorsLior Yosef, Eyal Simhon
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AssigneeM.D. Mechanical Devices Ltd.
InventorsLior Yosef, Eyal Simhon
Estimating the term…
A temperature-forcing system and method for controlling the temperature of an electronic device under test comprises a temperature-forcing head, including a face positionable in thermal contact with the device, and an evaporator, in direct or indirect thermal contact with the face; and a refrigerant circulation subsystem, including a compressor, a condenser, a flow control device for inducing a pressure drop in the refrigerant, and a conduit circuit through which the refrigerant is flowable. The subsystem cooperates with the evaporator so as to define at least one closed loop through which a corresponding bi-phase refrigerant is circulatable, so that, during circulation, the refrigerant is maintained in a liquid phase between the compressor and the flow control device and in a gaseous phase while flowing through the evaporator. The temperature of the device is therefore switchable by the head at a rapid rate of 50 to 150 degrees Celsius per minute.
A temperature-forcing system, for controlling the temperature of an electronic device under test, comprising:
A temperature-forcing head, for controlling the temperature of an electronic device under test, comprising a thermal contactor, configured with a face adapted for thermal contact with the device, and an evaporator, in direct or indirect thermal contact with the thermal contactor and configured to be connectable to a circulation system for circulating a bi-phase refrigerant in a gaseous phase through the evaporator and in a liquid phase through a condenser, wherein the temperature of said device is switchable by means of said head at a rate of 50 to 150 degrees Celsius per minute.
A method for dissipating heat from a thermal head while in thermal contact with an electronic device under test, comprising:
A method for forcing the temperature of an electronic device under test, comprising:
Dependencies are inferred from the claim text.