Method of Diagnosable Scan Chain
AssigneeInternational Business Machines Corporation
InventorsLiang Chen, Guofan Jiang, Teng Lin, Yang Liu
Life of this patent
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Abstract
Embodiments of the present invention relate to a method and apparatus for diagnosing a scan chain. Specifically, a method for a scan chain according to one embodiment of the present invention comprises: obtaining an initial structure of the scan chain; determining at least one scan register pair with backward dependency, according to function modules corresponding to scan registers on the scan chain; and adjusting the structure of the scan chain such that the at least one scan register pair with backward dependency becomes a scan register pair with forward dependency. By means of the solution according to embodiments of the present invention, the diagnosability of a scan chain may be enhanced.
Claims10
A method for implementing a scan chain to test a semiconductor, the method comprising:
- obtaining an initial structure of the scan chain;
- determining, according to function modules of the semiconductor corresponding to scan registers on the scan chain, at least one scan register pair with backward dependency, and
- adjusting the structure of the scan chain such that the at least one scan register pair with backward dependency becomes a scan register pair with forward dependency.
An apparatus for a scan chain, the apparatus comprising:
- an obtaining module configured to obtain an initial structure of the scan chain;
- a determining module configured to determine, according to function modules corresponding to scan registers on the scan chain, at least one scan register pair with backward dependency, and
- an adjusting module configured to adjust the structure of the scan chain such that the at least one scan register pair with backward dependency becomes a scan register pair with forward dependency.
Dependencies are inferred from the claim text.