Nonvolatile semiconductor device and method for testing the same
AssigneeSK hynix Inc.
InventorsSang Kug LYM, Yoon Jae SHIN
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Abstract
A nonvolatile semiconductor device and a method for testing the same are provided. The nonvolatile semiconductor device includes a current generating unit configured to generate a set write current depending on a step pulse that is generated based on a reference current and output the set write current to a memory cell, and a current measuring unit configured to measure a step duration of the step pulse and output a measured result outside of a chip during an activation period of a test enable signal.
Claims20
A nonvolatile semiconductor device, comprising:
- a current generating unit configured to generate a set write current depending on a step pulse that is generated based on a reference current and output the set write current to a memory cell;
- and
- a current measuring unit configured to measure a step duration of the step pulse and output the step duration outside of a chip during an activation period of a test enable signal.
A method for testing a nonvolatile semiconductor device, the method comprising:
- generating a set write current depending on a step pulse that is generated based on a reference current and outputting the set write current to a memory cell;
- and
- measuring a step duration of the step pulse and outputting the step duration outside of a chip during an activation period of a test enable signal.
Dependencies are inferred from the claim text.