Method and system for calibrating a spatial optical modulator in an optical microscope
AssigneeEcole Polytechnique
InventorsDelphine Debarre, Thibault Vieille, Emmanuel Beaurepaire, Jean-Louis Martin
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AssigneeEcole Polytechnique
InventorsDelphine Debarre, Thibault Vieille, Emmanuel Beaurepaire, Jean-Louis Martin
Estimating the term…
A method and system for calibrating an optical device having a spatial optical modulator (6) and including: an optical lens (8) of a large numerical aperture, capable of receiving an incident beam and/or collecting an optical beam reflected by a sample; a camera (14) disposed in a plane optically conjugate with the focal plane of the lens (8); and a spatial optical modulator (6) disposed on the optical beam upstream of the camera (14). The method includes the following steps consisting in: acquiring three-dimensional images of the PSF in terms of intensity in a plane conjugate with the focal plane of the lens (8), reconstructing the profile in terms of amplitude and/or phase of the beam using a phase diversity algorithm, and determining the respective influence functions of a plurality of elements P1, . . . , PN of the spatial optical modulator (6) on the profile in terms of the amplitude A and/or phase φ of the beam.
A method for the calibration of an optical device having a spatial optical modulator (6), said device comprising a light source point (1), an optical objective (8) of large numerical aperture adapted to receive an incident beam and/or to collect an optical beam reflected by a sample, a camera (14) placed in a plane that is optically conjugate to the focal plane of the objective (8) and a spatial optical modulator placed on the optical beam upstream of the camera (14), said method comprises the following steps:
A system for the calibration of an optical device having a spatial optical modulator (6), said device comprising a light source point (1) generating an incident beam (1a), an optical objective (8) of large numerical aperture adapted to receive an incident beam and/or to collect an optical beam reflected by a sample, an image of the source point (1) being formed in the focal plane of the objective (8), a spatial optical modulator (6) comprising a plurality of elements (P1, . . . PN) and means for controlling said elements (P1, . . . PN), the spatial optical modulator (6) being placed on the optical beam so as to modulate the incident and/or reflected optical beam, said system of calibration comprising:
Dependencies are inferred from the claim text.