Back to results
US 2013/0276176 A1Published application
Atomic force microscope probe, method for preparing same, and uses thereof
AssigneeCommissariat A L' Energie Atomique Et Aux Energies Alternatives
InventorsJérôme Polesel-Maris, Thomas Berthelot, Pascal Viel
Life of this patent
Estimating the term…
Abstract
An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and functionalized with at least one group or molecule of interest is disclosed. The disclosed technology also relates to preparation method and to different uses thereof.
Claims22
An atomic force microscope probe comprising:
- a piezo-electric resonator provided with two electrodes and coated with an insulating layer;
- and
- a tip attached on the resonator coated and functionalized with at least one group or molecule of interest.
Dependencies are inferred from the claim text.