Apparatus and method for measuring thickness of printed circuit board
AssigneeAvago Technologies Wireless IP (Singapore) Pte. Ltd.
InventorJin JEONG
Life of this patent
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Abstract
An apparatus for measuring a thickness of at least one insulating layer of a printed circuit board (PCB), the at least one insulating layer having a transmission line located thereon. The apparatus includes an impedance measurement unit configured to input a plurality of input signals to the transmission line, each of the input signals having a respective frequency, to receive output signals from the transmission line, and to determine impedance values of the at least one insulating layer based on the input signals and the output signals; and a thickness calculation unit configured to calculate a thickness of the at least one insulating layer based on the impedance values.
Claims12
An apparatus for measuring a thickness of at least one insulating layer of a printed circuit board (PCB), the at least one insulating layer having a transmission line located thereon, the apparatus comprising:
- an impedance measurement unit configured to input a plurality of input signals to the transmission line, to receive output signals from the transmission line, and to determine impedance values of said at least one insulating layer based on the input signals and the output signals, wherein each of the input signals has a respective frequency;
- and
- a thickness calculation unit configured to calculate a thickness of the at least one insulating layer based on the impedance values.
A method of measuring a thickness of at least one insulating layer of a printed circuit board (PCB), the at least one insulating layer having a transmission line located thereon, the method comprising:
- measuring impedance values by inputting a plurality of input signals to the transmission line, by receiving output signals from the transmission line, and by determining impedance values based on the input signals and the output signals, wherein each of the input signals has a respective frequency;
- and
- calculating a thickness of the at least one insulating layer based on the measured impedance values.
Dependencies are inferred from the claim text.