Method For Reducing Direct Hit Artifacts And X-Ray Facility
AssigneeSiemens Aktiengesellschaft
InventorBoris Stowasser
Life of this patent
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Abstract
A method for reducing artifacts produced by x-ray radiation directly striking a measuring pixel of a CMOS detector after crossing a scintillator, wherein, for an x-ray image recorded using the CMOS detector, artifact image points are extracted by applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point and comparison with the image to which the smoothing operator was applied, and their image data is corrected.
Claims19
A method for reducing artifacts produced by x-ray radiation directly striking a measuring pixel of a CMOS detector after crossing a scintillator, comprising:
- extracting artifact image points from an x-ray image profile recorded using the CMOS detector by:
- applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point to generate a smoothed image profile,
- comparing the smoothed image profile with the -ray image profile to which the smoothing operator was applied, and
- identifying artifact image points based on the results of the comparison, and
- correcting image data associated with the identified artifact image points.
An x-ray facility comprising:
- a CMOS detector having a scintillator and a pixel matrix with measuring pixels for receiving secondary radiation generated in the scintillator, and
- a computation device configured to:
- extract artifact image points from an x-ray image profile recorded using the CMOS detector by:
- applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point to generate a smoothed image profile,
- comparing the smoothed image profile with the -ray image profile to which the smoothing operator was applied, and
- identifying artifact image points based on the results of the comparison, and
- correct image data associated with the identified artifact image points.
Dependencies are inferred from the claim text.