Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation
AssigneeBruker AXS GmbH
InventorsHeinz Amenitsch, Benedetta Marmiroli, Peter Laggner
Life of this patent
Estimating the term…
Abstract
An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample is configured such as to allow the X-ray radiation to impinge along a first direction (117, 217, 317, 417, 517, 617) through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction (119, 219, 319, 419, 519, 619) different from the first direction to be detected by a detector. Further, a system for measuring an intensity of X-ray radiation scattered by a liquid sample and corresponding methods are provided.
Claims18
1-18. (canceled)
An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample, the apparatus comprising:
- a first support member having a first surface;
- a second support member having a second surface, the first surface and the second surface being adapted such that the liquid sample is supportable between the first surface and the second surface by a surface tension force,
- wherein the apparatus is configured such as to allow the X-ray radiation to impinge along a first direction through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction different from the first direction to be detected by a detector, wherein the first member and/or the second member comprises an X-ray transparent window comprising diamond and/or silicon nitride.
An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample, the apparatus comprising:
- a first support member having a first surface;
- a second support member having a second surface, the first surface and the second surface being adapted such that the liquid sample is supportable between the first surface and the second surface by a surface tension force,
- wherein the apparatus is configured such as to allow the X-ray radiation to impinge along a first direction through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction different from the first direction to be detected by a detector,
- wherein the first member and/or the second member comprises an X-ray transparent window comprising diamond and/or silicon nitride,
- wherein the liquid sample contacts the first surface at a first wetted area of the first surface and contacts the second surface in a second wetted area of the second surface.
A system for measuring an intensity of X-ray radiation scattered by a liquid sample, the system comprising:
- the apparatus according to claim 1;
- and
- a detector system configured for detecting the intensity of the X-ray radiation impinged along the first direction through the first support member onto the liquid sample and having left the liquid sample through the second member along the second direction.
A method for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample, the method comprising:
- providing a first support member having a first surface;
- providing a second support member having a second surface;
- supporting the liquid sample between the first surface and the second surface by a surface tension force;
- arranging the first member and the second member such as to allow the X-ray radiation to impinge along a first direction through the first support member onto the liquid sample and to allow the X-ray radiation scattered by the liquid sample to leave the liquid sample through the second member along a second direction different from the first direction to be detected by a detector.
Dependencies are inferred from the claim text.