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US 2013/0258778 A1Published application
Read voltage generation circuit, memory and memory system including the same
AssigneeSK hynix Inc.
InventorSeung-Min OH
Life of this patent
Estimating the term…
Abstract
A read voltage generation circuit includes a register unit configured to store an initial read voltage code, a counter circuit configured to change a read voltage code in every read-retry operation, wherein an initial value of the read voltage code is the initial read voltage code; and a voltage generation circuit configured to generate a read voltage corresponding to a read voltage code produced by the counter circuit.
Claims13
A read voltage generation circuit comprising:
- a register unit configured to store an initial read voltage code;
- a counter circuit configured to change a read voltage code in every read-retry operation, wherein an initial value of the read voltage code is the initial read voltage code;
- and
- a voltage generation circuit configured to generate a read voltage corresponding to the read voltage code produced by the counter circuit.
1 more element
A memory comprising:
- a plurality of memory blocks;
- a row circuit configured to apply a read voltage to a selected page in a selected memory of the plurality of memory blocks;
- a data access circuit configured to read data from the selected page;
- a register configured to store an initial read voltage code;
- a counter circuit configured to change a read voltage code in every read-retry operation, wherein an initial value of the read voltage code is the initial read voltage code;
- and
- a voltage generation circuit configured to generate the read voltage corresponding to the read voltage code produced by the counter circuit.
4 more elements
A memory system comprising:
- a memory configured to include a plurality of memory blocks and a read voltage generation circuit configured to generate a read voltage that is the reference of reading of a selected memory in the memory blocks;
- and
- a memory controller configured to give an instruction of a read-retry operation on the selected memory block to the memory, when reading on the selected memory block has failed,
- wherein the read voltage generation circuit includes:
- a register configured to store an initial read voltage code;
- a counter circuit configured to change a read voltage code in every read-retry operation, wherein an initial value of the read voltage code is the initial read voltage code;
- and
- a voltage generation circuit configured to generate a read voltage corresponding to the read voltage code produced by the counter circuit.
5 more elements
Dependencies are inferred from the claim text.