Semiconductor device and variation information obtaining program

A variation information obtaining program for obtaining manufacture variation information of a transistor in a semiconductor device comprising:

• an oscillation circuit oscillating an output signal having predetermined frequency;
• and a control circuit outputting a current set value which switches operation current of the oscillation circuit between a first current value and a second current value, and
• the program for making the control circuit obtain first frequency information related to frequency of the output signal in a state where the operation current is set to the first current value, obtain second frequency information related to frequency of the output signal in a state where the operation current is set to the second current value, and obtain Manufacture variation information of a circuit element as a component of the oscillation circuit on the basis of a difference value between the first and second frequency information.