X-ray backscatter system and method for detecting discrepancies in items
AssigneeThe Boeing Company
InventorsWilliam Talion Edwards, Gary E. Georgeson, James E. Engel
Life of this patent
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Abstract
A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.
Claims20
A method for detecting discrepancies in an item comprising:
- directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item;
- detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and
- forming a one-dimensional image of the item from the detected reflected energy waves.
A system for detecting discrepancies in an item, the system comprising:
- an emitter for emitting energy waves at the item, wherein a portion of the emitted energy waves are reflected back from the item as reflected energy waves;
- a detector for detecting the reflected energy waves from the item;
- an image-former for forming a one-dimensional image of the item from detected reflected energy waves.
A system for detecting discrepancies in an item, the system comprising:
- an X-ray emitter for emitting X-rays at an item, wherein a portion of the emitted X-rays are reflected back from the item;
- a one-dimensional backscatter X-ray detector for detecting X-rays reflected back from the item along one dimension;
- an image processor for generating a one-dimensional image from the detected X-rays backscattered from the item.
Dependencies are inferred from the claim text.