# US 2013/0240752 A1 · Methods and systems for detecting or collecting particles

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- Number: US 2013/0240752 A1
- Document ID: US20130240752A1
- Status: Published application
- Kind: A1
- Application number: 13/807,148
- Filed: 2011-06-28
- Published: 2013-09-19
- Earliest claimed: 2010-06-29
- Assignees: Empire Technology Development LLC
- Inventors: Yuchen Ma
- Web page: https://patentgrep.com/patent/US20130240752A1

## CPC

- G01N 15/1031: by measuring electrical or magnetic effects
- B03C 3/025: {Combinations of electrostatic separators, e.g. in parallel or in series, stacked separators or dry-wet separator combinations}
- B03C 3/08: characterised by presence of stationary flat electrodes arranged with their flat surfaces parallel to the gas stream
- B03C 3/12: characterised by separation of ionising and collecting stations
- B03C 3/145: Inertia
- G01N 15/02: Investigating particle size or size distribution (by measuring osmotic pressure G01N7/10; investigating sedimentation of particle suspensions G01N15/04; investigating individual particles G01N15/10)
- B03C 2201/10: Ionising electrode with two or more serrated ends or sides
- B03C 2201/16: Magnetic separation of gases from gases, e.g. oxygen from air
- B03C 2201/24: for measuring or calculating of parameters, e.g. efficiency
- G01N 2001/4038: {electric methods, e.g. electromigration, electrophoresis, ionisation}
- G01N 2015/0038: {Investigating nanoparticles}
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- B03C: MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS (separating isotopes B01D59/00; combinations of magnetic or electrostatic separation with separation of solids by other means B03B, B07B)

## Abstract

Methods and systems for detecting and/or collecting particles are disclosed. At least some of the particles are electrically charged by a charger (122). At least some of the charged particles are collected by a collector (140). Information indicating the number of the detected/collected particles based on measured electrical charges of the charged particles is obtained by a processor (170).

## Claims

### Claim 1

An apparatus for detecting or collecting particles, the apparatus comprising:
a charger to electrically charge at least some of the particles;
a collector to collect at least some of the charged particles; and
a processor to obtain information indicative of an amount of the detected/collected particles based on measured electrical charges of the charged particles.

### Claim at position 2

2-19. (canceled)

### Claim 20 (depends on 1)

The apparatus of claim 1, further comprising a diluter to reduce a density of the particles being measured.

### Claim 21 (depends on 20)

The apparatus of claim 20, wherein the diluter comprises a plurality of grading chambers.

### Claim 22 (depends on 21)

The apparatus of claim 21, further comprising a plurality of connectors between two of the plurality of grading chambers, wherein the plurality of connectors each have a different diameter.

### Claim 23 (depends on 20)

The apparatus of claim 20, wherein the diluter comprises a sub-chamber and a vacuum valve, wherein the one of the plurality of grading chambers is configured to be evacuated through the vacuum valve, and wherein the sub-chamber is configured to release its content into the one of the plurality of grading chambers to have a diluted content.

### Claim 24 (depends on 20)

The apparatus of claim 20, wherein the diluter comprises a plurality of grading channels, each having a different diameter.

### Claim 25 (depends on 1)

The apparatus of claim 1, wherein the collector is configured to measure electrical pulses caused by the collected charged particles, wherein the measured electrical pulses are above a pulse threshold, wherein the collector comprises an electrical pulse detector configured to measure electrical charges based on at least one of a Coulomb repulsion between charged particles, a movement of a charged particle in a magnetic field, a movement of a charged particle in an electric field, or a change in capacitance due to the charged particles.

### Claim 26

(canceled)

### Claim 27 (depends on 25)

The apparatus of claim 25, wherein the particles have sizes of about 0.1 nm to about 1000 nm.

### Claim 28 (depends on 1)

The apparatus of claim 1, wherein the collector comprises a conductive curved shell configured to have the charged particles move along a surface thereof.

### Claim 29 (depends on 28)

The apparatus of claim 28, wherein the charged particles are configured to be dispersed throughout the surface of the conductive curved shell by a Columbic repulsion.

### Claim 30 (depends on 1)

The apparatus of claim 1, wherein the collector comprises:
a conductive mesh to collect the charged particles; and
at least one of an electric field generator and a magnetic field generator to modify trajectories of the charged particles.

### Claim at position 14

31-34. (canceled)

### Claim 35

A method of detecting or collecting particles, the method comprising:
electrically charging at least some of the particles in a flow;
collecting at least some of the charged particles; and
obtaining information indicative of an amount of the detected/collected particles based on electrical charges of the collected charged particles.

### Claim 36 (depends on 35)

The method of claim 35, further comprising measuring the electrical charges, wherein the measuring comprises detecting current pulses caused by the collected charged particles, and wherein the detecting is based on at least one of a Coulomb repulsion between charged particles, a movement of charged particles in a magnetic field, a movement of charged particles in an electric field, or a change in capacitance due to the charged particles.

### Claim 37

(canceled)

### Claim 38

(canceled)

### Claim 39 (depends on 36)

The method of claim 36, further comprising determining a detection threshold of the current pulses.

### Claim 40 (depends on 36)

The method of claim 36, further comprising:
measuring electrical charges at a plurality of locations; and
processing measured data from the plurality of locations using a single processor.

### Claim 41 (depends on 35)

The method of claim 35, further comprising dispersing the charged particles over a curved conductive shell.

### Claim 42 (depends on 41)

The method of claim 41, wherein the curved conductive shell has a semispherical surface.

### Claim 43 (depends on 42)

The method of claim 42, wherein the dispersing is through a Coulomb repulsion.

### Claim at position 24

44-45. (canceled)

### Claim 46 (depends on 35)

The method of claim 35, further comprising diluting a density of the particles in the flow using a plurality of grading chambers.

### Claim 47

(canceled)

### Claim 48

(canceled)

### Claim 49 (depends on 35)

The method of claim 35, further comprising modifying trajectories of the charged particles with at least one of an electric field or a magnetic field.

### Claim at position 29

50-63. (canceled)
