Method of valuing a patent using metric characteristics of similar patents granted earlier
OwnerMark T. Lane, G. Edward Powell, JR. +1inventors
InventorsMark T. Lane, G. Edward Powell, JR., N. edward White
Life of this patent
Estimating the term…
Abstract
A method of valuing a patent using metric characteristics of similar patents granted earlier, whereas said metrics comprise a variety of estimated future characteristics, normalized using estimated future market size. Similar patents are identified using a combination of one or more metric characteristics, for example, patent value estimate, semantic similarity, dependent claim counts, cited patent counts, word counts, patent counts within assigned classes/subclasses, and distinct assignee counts.
Claims14
A method for predicting a future patent metric, comprising the steps of:
- choosing a first age relative to a point in time selected from the group consisting of application date, first office action date, second office action date, issue date, and expiration date for a first patent;
- determining the number of forward citations at said first age, for said first patent;
- choosing a second age relative to a point in time selected from the group consisting of application date, first office action date, second office action date, issue date, and expiration date, to be targeted;
- choosing a first deviation quantity, including zero;
- choosing a second deviation quantity, including zero;
- identifying by computer other patents within a patent landscape, with the same said number of forward citations plus or minus said first deviation quantity, when at the same said first age, plus or minus said second deviation quantity, as said first patent;
- choosing a patent metric;
- and
- predicting a future value at said second age, of said patent metric, for said first patent, by calculating an average value, using a method selected from the group consisting of mean, median, and mode, of said patent metric, at said second age, for said other patents.
A method for predicting a future patent metric, comprising the steps of:
- choosing a first age relative to a point in time selected from the group consisting of application date, first office action date, second office action date, issue date, and expiration date, for a first patent;
- determining the number of forward citations at said first age, for said first patent;
- choosing a second age relative to a point in time selected from the group consisting of application date, first office action date, second office action date, issue date, and expiration date, to be targeted;
- choosing a first deviation quantity, including zero;
- choosing a second deviation quantity, including zero;
- identifying by computer other patents within a patent landscape, with the same said number of forward citations plus or minus said first deviation quantity, when at the same said first age, plus or minus said second deviation quantity, as said first patent;
- choosing a patent metric;
- predicting a minimum future value at said second age, of said patent metric, for said first patent, by selecting the minimum value of said patent metric, from said other patents, at said second age;
- and
- predicting a maximum future value at said second age, of said patent metric, for said first patent, by selecting the maximum value of said patent metric, from said other patents, at said second age.
A method for estimating present patent value, comprising the steps of:
- determining a future value for a first patent;
- assigning a present intrinsic value to said first patent,
- calculating a first intermediate value, by subtracting said present intrinsic value from said future value of said first patent;
- choosing a discount rate;
- calculating a second intermediate value, by discounting said first intermediate value using said discount rate;
- and
- estimating a present value for said first patent, by adding said second intermediate value to said present intrinsic value.
Dependencies are inferred from the claim text.