Contact pressure detection apparatus and contact point pressure measurement apparatus
AssigneeAdvantest Corporation
InventorsMasao FUJINO, Toshiaki HAYAKAWA
Life of this patent
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AssigneeAdvantest Corporation
InventorsMasao FUJINO, Toshiaki HAYAKAWA
Estimating the term…
To measure contact pressure of each of a plurality of small protrusions arranged at a narrow pitch and contacting a flat surface, provided is a contact pressure detection apparatus comprising a sensor section that is contacted by a target and has pressure applied thereto by the target; a light source section that radiates light with a wavelength causing Raman scattering in the sensor section to which the pressure is applied; and a detecting section that receives light from the sensor section and detects the pressure between the sensor section and the target. Also provided is a contact point pressure measurement apparatus that measures contact pressure of an electrode of a device under test, comprising: a fixing section that has the device under test mounted thereon and fixes the electrode of the device under test in a manner to press against the sensor section; and the contact pressure detection apparatus.
A contact pressure detection apparatus comprising:
A contact pressure detecting method comprising:
Dependencies are inferred from the claim text.