Method and apparatus for in situ preparation of serial planar surfaces for microscopy
OwnerJoseph C. Robinsoninventor
Life of this patent
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Abstract
Systems and methods for preparing solid samples for analysis, such as microscopic examination in cross section or planimetric orientation. The sample preparation systems may include a sample support configured to secure a solid sample, an excitation beam source that generates an excitation beam configured to remove material from a surface of the sample, a beam shield configured to at least partially protect the sample from the excitation beam, and a beam shield holder configured to secure the beam shield, where the adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the sample.
Claims31
A sample preparation system comprising:
- a sample support, configured to secure a solid sample;
- an excitation beam source that generates an excitation beam configured to remove material from a surface of the solid sample;
- a beam shield configured to at least partially protect the solid sample from the excitation beam;
- and
- a beam shield holder configured to secure the beam shield;
- wherein adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the solid sample.
A sample preparation system comprising:
- a sample support, configured to secure a solid sample;
- an excitation beam source that generates an excitation beam configured to remove material from a surface of the solid sample;
- a beam shield configured to protect the solid sample from the excitation beam;
- and
- a beam shield holder configured to secure the beam shield;
- wherein a position of least one of the beam shield and the sample support is incrementally adjustable with respect to the other;
- and
- wherein the sample preparation system is mounted within a vacuum chamber of a microscope or analytical instrument configured to monitor the solid sample.
A sample preparation system comprising:
- a sample support, configured to secure a solid sample;
- an excitation beam source that generates a laser beam configured to remove material from a surface of the solid sample;
- a beam shield configured to protect the solid sample from the laser beam;
- and
- a beam shield holder configured to secure the beam shield;
- wherein a position of at least one of the beam shield and the sample support is incrementally adjustable with respect to the other;
- and
- wherein the sample preparation system is mounted within a vacuum chamber of a microscope or analytical instrument configured to monitor the solid sample.
A method of preparing an analytical sample, comprising:
- securing a sample in a sample holder;
- mounting a beam shield so that the beam shield is positioned just below and parallel with an upper surface of the sample;
- exposing the sample to an excitation beam configured to remove sample material and generate a first exposed sample surface;
- adjusting the position of at least one of the beam shield and the sample so as to expose an additional portion of the sample to the excitation beam;
- and
- exposing the sample to the excitation beam to remove additional sample material and generate a second exposed sample surface.
A method of preparing an analytical sample, comprising:
- securing a sample in a sample holder;
- mounting a beam shield that includes a plurality of slits so that the beam shield is positioned adjacent to and parallel with an upper surface of the sample;
- exposing the sample to an excitation beam configured to remove sample material and thereby generating alternating and sequential slices in the sample.
The claim of paragraph 29, wherein exposing the sample to the excitation beam creates a plurality of parallel trenches in the sample that define at least one thin sample lamella.
Dependencies are inferred from the claim text.