Method of testing flash memory
AssigneeFluiditech IP Limited
InventorYung-Chiang Chu
Life of this patent
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Abstract
A method of testing a flash memory is applied to retrieve the flash memory available by picking up a defective flash memory. The flash memory includes at least a block, a page, and a cell. The method comprises inputting a test command into the flash memory to execute at least one of write, read, or compare of the flash memory. After the test command is executed, the states of the block, page, and cell in the flash memory may be obtained. The states are marked in a flash memory distribution list to allow a controller to access at least one of the normal block, page, and cell from the list. Thus, in the method, the normal block, page, and cell may be obtained.
Claims23
A method of testing a flash memory, being applied to retrieve the flash memory available by picking up a defective flash memory, the flash memory comprising a block, a page, and a cell, the method comprising:
- (a) inputting a test command into the flash memory to execute at least one of write, read, or compare of the flash memory;
- (b) obtaining at least one of the block, page, and cell that works in normal or abnormal state after the test command is executed;
- (c) marking at least one of the block, page, and cell in a flash memory distribution list;
- and
- (d) using at least one of the block, page, and cell marked as the normal state according to the flash memory distribution list.
Dependencies are inferred from the claim text.