Method of Forming Top Electrode for Capacitor and Interconnection in Integrated Passive Device (IPD)
AssigneeSTATS ChipPAC, Ltd.
InventorsYaojian Lin, Robert C. Frye
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AssigneeSTATS ChipPAC, Ltd.
InventorsYaojian Lin, Robert C. Frye
Estimating the term…
A method of manufacturing a semiconductor device includes providing a substrate having a first conductive layer disposed on a top surface of the substrate. A high resistivity layer is formed over the substrate and the first conductive layer. A dielectric layer is deposited over the substrate, first conductive layer and high resistivity layer. A portion of the dielectric layer, high resistivity layer, and first conductive layer forms a capacitor stack. A first passivation layer is formed over the dielectric layer. A second conductive layer is formed over the capacitor stack and a portion of the first passivation layer. A first opening is etched in the dielectric layer to expose a surface of the high resistivity layer. A third and fourth conductive layer is deposited over the first opening in the dielectric layer and a portion of the first passivation layer.
A method of making a semiconductor device, comprising:
A method of making a semiconductor device, comprising:
A method of making a semiconductor device, comprising:
A method of making a semiconductor device, comprising:
Dependencies are inferred from the claim text.