Visual Inspection Device, Visual Inspection Method, And Computer Program
AssigneeKeyence Corporation
InventorsNaoya Uchiyama, Hidetoshi Morimoto
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AssigneeKeyence Corporation
InventorsNaoya Uchiyama, Hidetoshi Morimoto
Estimating the term…
Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are previously accepted and stored, and a defect threshold for detecting a defective portion of an inspection object is set based on the plurality of stored images. A defect amount to be compared with a determination threshold for making a non-defective/defective determination on the inspection object is calculated with respect to each of the plurality of stored images based on the set defective threshold, and whether or not each of the calculated defect amounts is an outlier is tested by use of at least one of a parametric technique and a non-parametric technique. Outlier information for specifying an image whose defect amount has been tested to be the outlier is displayed and outputted.
A visual inspection device which compares a captured image of an inspection object with a group of images of items regarded as non-defective items to make a non-defective/defective determination, the device comprising:
A visual inspection method executable by a visual inspection device which compares a captured image of an inspection object with a group of images of items regarded as non-defective items to make a non-defective/defective determination, the method comprising the steps of
A computer program that is present on a movable recording medium, the computer program executable by a visual inspection device which compares a captured image of an inspection object with a group of images of items regarded as non-defective items to make a non-defective/defective determination, the computer program causing the visual inspection device to function as:
Dependencies are inferred from the claim text.