System and Process for Roof Measurement Using Aerial Imagery
AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Life of this patent
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AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Estimating the term…
Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
A process for determining attributes of a roof structure of a real-world three-dimensional building, comprising the acts of:
A non-transient computer memory storing computer logic, that when executed by computer hardware causes the computer hardware to determine attributes of a roof structure of a real-world three-dimensional building by:
Dependencies are inferred from the claim text.