US 2013/0170307 A1 · ELECTRONIC DEVICE AND METHOD FOR TESTING ENDURANCE OF MEMORY

Abstract

An electronic device for endurance test of a memory includes an interface, a storage unit, an obtaining unit, and a control unit. The interface is for connecting the memory to the electronic device. The storage unit stores a variety of test packages for different storage capacities of memories and at least one test option associated with each test package. The test option defines a predetermined capacity of the associated memory to be tested. The obtaining unit obtains a storage capacity of the memory connected to the electronic device. The control unit selects one of the at least one test option associated with one of the test packages corresponding to the obtained storage capacity, selects a plurality of blocks according to the predetermined capacity of the selected test option, assigns corresponding logical addresses to the selected blocks, and then tests the endurance of the selected blocks.

Claims12

Dependent claims

An electronic device for endurance test of a memory, the memory comprising a plurality of blocks, the electronic device comprising:

an interface to connect the memory to the electronic device;
a storage unit to store a plurality of test packages for different storage capacities of memories and at least one test option associated with each test package, and each test option defining a predetermined capacity of the associated memory to be tested;
an obtaining unit to obtain a storage capacity of the memory connected to the electronic device;
and
a control unit to select one of the at least one test option associated with one of the test packages corresponding to the obtained storage capacity, select a plurality of blocks according to the predetermined capacity of the selected test option, assign corresponding logical addresses to the selected blocks, and test the endurance of the selected blocks.

2 more elements

A method for endurance test of a memory applied to an electronic device, the memory comprising a plurality of blocks, method comprising:

connecting the memory to the electronic device;
obtaining a storage capacity of the memory connected to the electronic device;
selecting one test option associated with a test package corresponding to the obtained storage capacity, wherein the electronic device stores a plurality of test packages for different storage capacities of memories and at least one test option associated with each test package, and the test option defining a predetermined capacity of the associated memory to be tested;
and
selecting a plurality of blocks according to the predetermined capacity of the selected test option, assigning corresponding logical addresses to the selected blocks, and testing the endurance of the selected blocks.

2 more elements

Dependencies are inferred from the claim text.

Electronic device and method for testing endurance of memory

Life of this patent

Electronic device and method for testing endurance of memory

Life of this patent

Abstract

Claims12