# US 2013/0158904 A1 · Apparatus and method for assessing the integrity of analog-digital converter > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2013/0158904 A1 - Document ID: US20130158904A1 - Status: Published application - Kind: A1 - Application number: 13/707,107 - Filed: 2012-12-06 - Published: 2013-06-20 - Earliest claimed: 2011-12-16 - Assignees: Lear Corporation - Inventors: Antoni Ferre Fabregas; Jose Gabriel Fernandez Banares; David Gamez Alari - Web page: https://patentgrep.com/patent/US20130158904A1 ## CPC - G01R 27/00: Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom - G01R 35/005: {Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence)} - G06F 15/00: Digital computers in general (details G06F1/00 – G06F13/00); Data processing equipment in general - G01R 19/2506: {Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values (G01R19/003 takes precedence); Details concerning sampling, digitizing or waveform capturing (displaying waveforms G01R13/00; analog sampling G01R19/0053)} - G01R 31/007: {using microprocessors or computers} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract An apparatus for determining integrity of an electronic device in a vehicle is provided. The apparatus comprises a controller operably coupled to a high voltage measuring circuit and to an analog-to-digital converter (ADC). The high voltage measuring circuit receives a high voltage signal and includes at least one stressed resistor for reducing the high voltage signal into a suitable voltage signal. The ADC performs a measurement with the suitable voltage that is indicative of the high voltage signal in a normal operation mode. The controller is configured to apply a calibrated voltage to the at least one stressed resistor in a calibration mode. The controller is further configured to calculate a resistance value of the at least one stressed resistor based on applying the calibrated voltage to the at least one stressed resistor to determine if the at least one stressed resistor is in a stressed state. ## Claims ### Claim 1 An apparatus for determining integrity of an electronic device in a vehicle, the apparatus comprising: a controller operably coupled to a high voltage measuring circuit and to an analog-to-digital converter (ADC), the high voltage measuring circuit for receiving a high voltage signal and including at least one stressed resistor for reducing the high voltage signal into a suitable voltage signal to provide to the ADC to perform a measurement thereof that is indicative of the high voltage signal in a normal operation mode, the controller being configured to: apply a calibrated voltage to the at least one stressed resistor in a calibration mode; and calculate a resistance value of the at least one stressed resistor based on applying the calibrated voltage to the at least one stressed resistor to determine if the at least one stressed resistor is in a stressed state. ### Claim 2 (depends on 1) The apparatus of claim 1 wherein the controller is further configured to measure the calibrated voltage to generate a first measured voltage prior to applying the calibrated voltage to the at least one stressed resistor. ### Claim 3 (depends on 2) The apparatus of claim 2 wherein the controller is further configured to control at least one switch for preventing the measuring circuit to receive the high voltage signal and for enabling the measuring circuit to receive the calibrated voltage in the calibrated mode. ### Claim 4 (depends on 2) The apparatus of claim 2 wherein the controller is further configured to apply the calibrated voltage to the at least one stressed resistor to generate a second measured voltage. ### Claim 5 (depends on 4) The apparatus of claim 4 wherein the controller is further configured to calculate the resistance value of the at least one stressed resistor based on the second measured voltage. ### Claim 6 (depends on 1) The apparatus of claim 1 wherein the controller is further configured to control at least one switch for controlling the apparatus to move from the normal operating mode into the calibration mode. ### Claim 7 (depends on 1) The apparatus of claim 1 wherein the at least one stressed resistor cooperates with a first resistor to provide a voltage divider for reducing the high voltage signal into the suitable voltage signal to perform the measurement in the normal operation mode. ### Claim 8 (depends on 1) The apparatus of claim 1 wherein the high voltage signal is greater than 36 volts. ### Claim 9 (depends on 1) The apparatus of claim 1 wherein the high voltage signal is greater than 400 volts. ### Claim 10 An apparatus for determining integrity of an electrical device in a vehicle, the apparatus comprising: a high voltage measuring circuit for receiving a high voltage signal and including at least one stressed resistor for reducing the high voltage signal into a suitable voltage signal; an analog-to-digital converter (ADC) for receiving the suitable voltage level to perform a measurement thereof that is indicative of the high voltage signal in a normal operation mode; a controller configured to: apply a calibrated voltage to the at least one stressed resistor in a calibration mode; and calculate a resistance value of the at least one stressed resistor based on applying the calibrated voltage to the at least one stressed resistor to determine if the at least one stressed resistor is in a stressed state. ### Claim 11 (depends on 10) The apparatus of claim 10 wherein the controller is further configured to measure the calibrated voltage to generate a first measured voltage prior to applying the calibrated voltage to the at least one stressed resistor. ### Claim 12 (depends on 11) The apparatus of claim 11 wherein the controller is further configured to control at least one switch for preventing the measuring circuit to receive the high voltage signal and for enabling the measuring circuit to receive the calibrated voltage in the calibrated mode. ### Claim 13 (depends on 11) The apparatus of claim 11 wherein the controller is further configured to apply the calibrated voltage to the at least one stressed resistor to generate a second measured voltage. ### Claim 14 (depends on 13) The apparatus of claim 13 wherein the controller is further configured to calculate the resistance value of the at least one stressed resistor based on the second measured voltage. ### Claim 15 (depends on 10) The apparatus of claim 10 wherein the controller is further configured to control at least one switch for controlling the apparatus to move from the normal operating mode into the calibration mode. ### Claim 16 (depends on 10) The apparatus of claim 10 wherein the at least one stressed resistor cooperates with a first resistor to provide a voltage divider for reducing the high voltage signal into the suitable voltage signal to perform the measurement in the normal operation mode. ### Claim 17 (depends on 10) The apparatus of claim 10 wherein the high voltage signal is greater than 36 volts. ### Claim 18 (depends on 10) The apparatus of claim 10 wherein the high voltage signal is greater than 400 volts. ### Claim 19 A method for determining integrity of an electrical device in a vehicle, the method comprising: receiving a high voltage signal; reducing the high voltage signal via at least one stressed resistor to provide a suitable voltage signal; digitally converting the suitable voltage level to perform a measurement that is indicative of the high voltage signal in a normal operation mode; applying a calibrated voltage to the at least one stressed resistor in a calibration mode; and calculating a resistance value of the at least one stressed resistor based on applying the calibrated voltage to the at least one stressed resistor to determine whether the at least one stressed resistor is in stressed state. ### Claim 20 (depends on 19) The method of claim 19 further comprising measuring the calibrated voltage to generate a first measured voltage prior to applying the calibrated voltage to the at least one stressed resistor.