# US 2013/0154723 A1 · Performance, thermal and power management system associated with an integrated circuit and related method

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- Number: US 2013/0154723 A1
- Document ID: US20130154723A1
- Status: Published application
- Kind: A1
- Application number: 13/719,193
- Filed: 2012-12-18
- Published: 2013-06-20
- Earliest claimed: 2011-12-19
- Assignees: MediaTek Singapore Pte. Ltd.
- Inventors: Uming Ko; Gordon Gammie; Alice Wang
- Web page: https://patentgrep.com/patent/US20130154723A1

## CPC

- G05F 1/462: {as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic}
- G01R 31/2834: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}
- G01R 31/31721: {Power aspects, e.g. power supplies for test circuits, power saving during test (for scan test G01R31/318575)}
- G01R 31/31724: {Test controller, e.g. BIST state machine (for scan test G01R31/318555)}
- G05F 1/46: wherein the variable actually regulated by the final control device is DC (G05F1/625 takes precedence)
- G06F 1/206: {comprising thermal management}
- G06F 1/26: Power supply means, e.g. regulation thereof (for memories G11C)
- Y02D 10/00: Energy efficient computing, e.g. low power processors, power management or thermal management
- G05F: SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE

## Abstract

The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

## Claims

### Claim 1

A performance, thermal and power (PTP) management system associated with an integrated circuit (IC), comprising:
a performance circuit with adjustable configurations for simulating operations of the IC when receiving a supply voltage;
a sensing module configured to measure a characteristic of the performance circuit;
a memory for storing characterization data associated with the IC; and
a PTP controller configured to:
set the performance circuit in a specific configuration according to the characterization data; and
adjust a level of the supply voltage according to the characteristic of the performance circuit.

### Claim 2 (depends on 1)

The PTP management system of claim 1, wherein:
the characterization data includes a voltage-frequency relationship of the IC when operating at a predetermined temperature for a given application use; and
the PTP controller is further configured to calculate a specific voltage for operating the IC at a specific frequency and the predetermined room temperature according to the voltage-frequency relationship and adjust the level of the supply voltage according to the specific voltage.

### Claim 3 (depends on 2)

The PTP management system of claim 2, wherein:
the characterization data further includes a voltage-frequency-temperature relationship of the IC when operating at a plurality of predetermined temperatures for the given application use;
the sensing module is further configured to detect a temperature change of the IC; and
the PTP controller is further configured to calculate a specific compensation voltage associated with the temperature change at the specific frequency according to the voltage-frequency-temperature relationship and adjust the level of the supply voltage according to the specific voltage and the specific compensation voltage.

### Claim 4 (depends on 3)

The PTP management system of claim 3, wherein:
the characterization data further includes crossover voltages of the performance circuit in a plurality of configurations;
the sensing module is further configured to measure an IC voltage; and
the PTP controller is further configured to set the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 5 (depends on 4)

The PTP management system of claim 4, wherein:
the characterization data further includes a voltage difference between a non-aged voltage and an aged voltage of the performance circuit;
the sensing module is further configured to measure the non-aged voltage and the aged voltage of the performance circuit; and
the PTP controller is further configured to set the performance circuit in a configuration commensurate with the voltage difference.

### Claim 6 (depends on 5)

The PTP management system of claim 5, wherein:
the performance circuit includes a first PTP detector and a second PTP detector having an identical circuitry;
the PTP controller is further configured to:
power on the first PTP detector during a booting sequence of the IC and power off the first PTP detector after the booting sequence of the IC ends; and
power on the second PTP detector according to a system clock based on which the IC operates; and
the sensing module is further configured to measure the non-aged voltage from the first PTP detector and measure the aged voltage from the second PTP detector.

### Claim 7 (depends on 1)

The PTP management system of claim 1, further comprising setting the level of the supply voltage to a predetermined value for a given application use, wherein:
the characterization data includes a voltage-frequency-temperature relationship of the IC when operating at a plurality of predetermined temperatures for the given application use;
the sensing module is further configured to detect a temperature change of the IC; and
the PTP controller is further configured to calculate a specific compensation voltage associated with the temperature change at a specific frequency according to the voltage-frequency-temperature relationship and adjust the level of the supply voltage according to the specific compensation voltage.

### Claim 8 (depends on 7)

The PTP management system of claim 7, wherein:
the characterization data further includes crossover voltages of the performance circuit in a plurality of configurations;
the sensing module is further configured to measure an IC voltage; and
the PTP controller is further configured to set the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 9 (depends on 8)

The PTP management system of claim 8, wherein:
the characterization data further includes a non-aged performance and an aged performance of the performance circuit;
the sensing module is further configured to measure the non-aged performance and the aged performance of the performance circuit; and
the PTP controller is further configured to set the performance circuit in a configuration commensurate with a voltage difference which is calculated based on a difference between the non-aged performance and the aged performance.

### Claim 10 (depends on 9)

The PTP management system of claim 9, wherein:
the performance circuit includes a first PTP detector and a second PTP detector having an identical circuitry;
the PTP controller is further configured to:
power on the first PTP detector during a booting sequence of the IC and power off the first PTP detector after the booting sequence of the IC ends; and
power on the second PTP detector according to a system clock based on which the IC operates; and
the sensing module is further configured to measure the non-aged performance of the first PTP detector and measure the aged performance of the second PTP detector.

### Claim 11 (depends on 1)

The PTP management system of claim 1, further comprising setting the level of the supply voltage to a predetermined value for a given application use, wherein:
the characterization data is further associated with the performance circuit and includes crossover voltages of the performance circuit in a plurality of configurations;
the sensing module is further configured to measure an IC voltage; and
the PTP controller is further configured to set the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 12 (depends on 11)

The PTP management system of claim 11, wherein:
the characterization data further includes a non-aged performance and an aged performance of the performance circuit;
the sensing module is further configured to measure the non-aged performance and the aged performance of the performance circuit; and
the PTP controller is further configured to set the performance circuit in a configuration commensurate with a voltage difference which is calculated based on a difference between the non-aged performance and the aged performance.

### Claim 13 (depends on 12)

The PTP management system of claim 12, wherein:
the performance circuit includes a first PTP detector and a second PTP detector having an identical circuitry;
the PTP controller is further configured to:
power on the first PTP detector during a booting sequence of the IC and power off the first PTP detector after the booting sequence of the IC ends; and
power on the second PTP detector according to a system clock based on which the IC operates; and
the sensing module is further configured to measure the non-aged performance of the first PTP detector and measure the aged performance of the second PTP detector.

### Claim 14 (depends on 1)

The PTP management system of claim 1, further comprising setting the level of the supply voltage to a predetermined value for a given application use, wherein:
the characterization data is further associated with the performance circuit and includes a non-aged performance and an aged performance of the performance circuit;
the sensing module is further configured to measure the non-aged performance and the aged performance of the performance circuit; and
the PTP controller is further configured to set the performance circuit in a configuration commensurate with a voltage difference which is calculated based on a difference between the non-aged performance and the aged performance.

### Claim 15 (depends on 14)

The PTP management system of claim 14, wherein:
the performance circuit includes a first PTP detector and a second PTP detector having an identical circuitry;
the PTP controller is further configured to:
power on the first PTP detector during a booting sequence of the IC and power off the first PTP detector after the booting sequence of the IC ends; and
power on the second PTP detector according to a system clock based on which the IC operates; and
the sensing module is further configured to measure the non-aged performance of the first PTP detector and measure the aged performance of the second PTP detector.

### Claim 16

A method for performance, thermal and power (PTP) management system associated with an integrated circuit (IC), comprising:
providing a performance circuit with adjustable configurations for simulating operations of the IC when receiving a supply voltage;
providing characterization data associated with the IC;
setting the performance circuit in a specific configuration according to the characterization data; and
adjust a level of the supply voltage according to a characteristic of the performance circuit.

### Claim 17 (depends on 16)

The method of claim 16, further comprising:
providing the characterization data associated with the IC by acquiring a voltage-frequency relationship of the IC when operating at a predetermined temperature for a given application use;
calculating a specific voltage for operating the IC at a specific frequency and the predetermined room temperature according to the voltage-frequency relationship; and
adjusting the level of the supply voltage according to the specific voltage.

### Claim 18 (depends on 16)

The method of claim 16, further comprising:
providing the characterization data associated with the IC by acquiring a voltage-frequency-temperature relationship of the IC when operating at a plurality of predetermined temperatures for the given application use;
detecting a temperature change of the IC;
calculating a specific compensation voltage associated with the temperature change at the specific frequency according to the voltage-frequency-temperature relationship; and
adjusting the level of the supply voltage according to the specific voltage and the specific compensation voltage.

### Claim 19 (depends on 17)

The method of claim 17, further comprising:
measuring crossover voltages of the performance circuit in a plurality of configurations and an IC voltage; and
setting the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 20 (depends on 19)

The method of claim 19, further comprising:
powering on a first PTP detector of the performance circuit during a booting sequence of the IC and powering off the first PTP detector after the booting sequence of the IC ends;
powering on a second PTP detector of the performance circuit according to a system clock based on which the IC operates;
measuring a non-aged performance of the first PTP detector and an aged performance of the second PTP detector;
calculating a voltage difference based on a difference between the non-aged performance and the aged performance; and
setting the performance circuit in a configuration commensurate with the voltage difference.

### Claim 21 (depends on 16)

The method of claim 16, further comprising:
setting the level of the supply voltage to a predetermined value for a given application use;
providing the characterization data associated with the IC by acquiring a voltage-frequency-temperature relationship of the IC when operating at a plurality of predetermined temperatures for the given application use;
detecting a temperature change of the IC;
calculating a specific compensation voltage associated with the temperature change at the specific frequency according to the voltage-frequency-temperature relationship; and
adjusting the level of the supply voltage according to the specific compensation voltage.

### Claim 22 (depends on 21)

The method of claim 21, further comprising:
measuring crossover voltages of the performance circuit in a plurality of configurations and an IC voltage; and
setting the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 23 (depends on 22)

The method of claim 22, further comprising:
powering on a first PTP detector of the performance circuit during a booting sequence of the IC and powering off the first PTP detector after the booting sequence of the IC ends;
powering on a second PTP detector of the performance circuit according to a system clock based on which the IC operates;
measuring a non-aged performance of the first PTP detector and an aged performance of the second PTP detector;
calculating a voltage difference based on a difference between the non-aged performance and the aged performance; and
setting the performance circuit in a configuration commensurate with the voltage difference.

### Claim 24 (depends on 16)

The method of claim 16, further comprising:
setting the level of the supply voltage to a predetermined value for a given application use;
measuring crossover voltages of the performance circuit in a plurality of configurations and an IC voltage; and
setting the performance circuit in a configuration corresponding to a crossover voltage commensurate with the IC voltage.

### Claim 25 (depends on 24)

The method of claim 24, further comprising:
powering on a first PTP detector of the performance circuit during a booting sequence of the IC and powering off the first PTP detector after the booting sequence of the IC ends;
powering on a second PTP detector of the performance circuit according to a system clock based on which the IC operates;
measuring a non-aged performance of the first PTP detector and an aged performance of the second PTP detector;
calculating a voltage difference based on a difference between the non-aged performance and the aged performance; and
setting the performance circuit in a configuration commensurate with the voltage difference.

### Claim 26 (depends on 16)

The method of claim 16, further comprising:
setting the level of the supply voltage to a predetermined value for a given application use;
powering on a first PTP detector of the performance circuit during a booting sequence of the IC and powering off the first PTP detector after the booting sequence of the IC ends;
powering on a second PTP detector of the performance circuit according to a system clock based on which the IC operates;
measuring a non-aged performance of the first PTP detector and an aged performance of the second PTP detector;
calculating a voltage difference based on a difference between the non-aged performance and the aged performance; and
setting the performance circuit in a configuration commensurate with the voltage difference.