# US 2013/0154015 A1 · Three-dimension circuit structure and semiconductor device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2013/0154015 A1 - Document ID: US20130154015A1 - Status: Published application - Kind: A1 - Application number: 13/572,711 - Filed: 2012-08-13 - Published: 2013-06-20 - Earliest claimed: 2011-12-16 - Assignees: E Ink Holdings Inc. - Inventors: Wei-Chou Lan; Ted-Hong Shinn; Henry Wang; Chia-Chun Yeh - Web page: https://patentgrep.com/patent/US20130154015A1 ## CPC - H10D 30/6758: {characterised by the insulating substrates} - H10D 30/673: {characterised by the shapes, relative sizes or dispositions of the gate electrodes} - H10D 30/6739: {Conductor-insulator-semiconductor electrodes} - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES ## Abstract A three-dimension circuit structure includes a substrate, a first conductive layer, a filled material and a second conductive layer. The substrate has an upper surface and a cavity located at the upper surface. The first conductive layer covers the inside walls of the cavity and protrudes out the upper surface. The filled material fills the cavity and covers the first conductive layer. The second conductive layer covers the filled material and a portion of the first conductive layer, and the first conductive layer and the second conductive layer encapsulate the filled material. The material of the filled material is different from that of the first conductive layer and the second conductive layer. ## Claims ### Claim 1 A three-dimension circuit structure, comprising: a substrate, having an upper surface and a cavity located at the upper surface; a first conductive layer, covering the inside walls of the cavity and protruding out the upper surface; a filled material, filling the cavity and covering the first conductive layer; and a second conductive layer, covering the filled material and a portion of the first conductive layer, wherein the first conductive layer and the second conductive layer encapsulate the filled material, and the material of the filled material is different from that of the first conductive layer and the second conductive layer. ### Claim 2 (depends on 1) The three-dimension circuit structure according to claim 1, wherein the material of the substrate comprises an organic material or an inorganic material. ### Claim 3 (depends on 1) The three-dimension circuit structure according to claim 1, wherein the depth of the cavity is 1/10 to ½ of the thickness of the substrate. ### Claim 4 (depends on 1) The three-dimension circuit structure according to claim 1, wherein the filled material comprises an organic material, a polymer material or a polymer material containing a plurality of metal particles or a plurality of non-metal particles. ### Claim 5 (depends on 4) The three-dimension circuit structure according to claim 4, wherein the material of the metal particles comprises silver, and the material of the non-metal particle comprises carbon. ### Claim 6 (depends on 1) The three-dimension circuit structure according to claim 1, wherein the material of the first conductive layer and the material of the second conductive layer comprise metal or alloy. ### Claim 7 A semiconductor device, disposed on a base plate, the semiconductor device comprising: a substrate, having an upper surface and a cavity located at the upper surface; a first conductive layer, having a first conductive part disposed on a portion of the upper surface of the substrate and a second conductive part covering the inside walls of the cavity; a filled material, filling the cavity and covering the second conductive part; a second conductive layer, having a third conductive part covering the first conductive part and a fourth conductive part covering the filled material and a portion of the second conductive part, wherein the first conductive part and the third conductive part form a gate, the second conductive part, the filled material and the fourth conductive part form a three-dimension circuit, and the three-dimension circuit is connected to the gate; a gate insulating layer, covering the three-dimension circuit and the gate; a semiconductor layer, disposed on the gate insulating layer; a drain, disposed on the semiconductor layer; and a source, disposed on the semiconductor layer. ### Claim 8 (depends on 7) The semiconductor device according to claim 7, wherein the material of the substrate comprises an organic material or an inorganic material. ### Claim 9 (depends on 7) The semiconductor device according to claim 7, wherein the depth of the cavity is 1/10 to ½ of the thickness of the substrate. ### Claim 10 (depends on 7) The semiconductor device according to claim 7, wherein the filled material comprises an organic material, a polymer material or a polymer material containing a plurality of metal particles or a plurality of non-metal particles. ### Claim 11 (depends on 10) The semiconductor device according to claim 10, wherein the material of the metal particles comprises silver, and the material of the non-metal particles comprises carbon. ### Claim 12 (depends on 7) The semiconductor device according to claim 7, wherein the material of the first conductive layer and the material of the second conductive layer comprise metal or alloy. ### Claim 13 (depends on 7) The semiconductor device according to claim 7, further comprising a protective layer disposed on the substrate and covering the semiconductor layer, the drain and the source, wherein a portion of the drain is exposed out of the protective layer. ### Claim 14 (depends on 13) The semiconductor device according to claim 13, further comprising a pixel electrode, disposed on the substrate and connected to the portion of the drain exposed out of the protective layer.