Determining thread lead or pitch accurately
AssigneeHexagon Technology Center GmbH
InventorAlexander Ping Lee
Life of this patent
Estimating the term…
Abstract
Apparatus and methods are provided for measuring thread leads or pitches using a metrology probe. The probe may be, for example, either a contact probe or a laser probe. The probe is mounted on the end of an articulating arm that has sensors to provide precise three-dimensional coordinates of the probe's location and orientation. The probe determines surface coordinates of the threaded object repetitively in different locations according to a program provided by a computer connected to the arm. When enough data have been gathered, the computer calculates and outputs a surface profile of the threaded object, including a lead or pitch measurement.
Claims25
A computerized method for inspecting the thread of a threaded object, the method comprising:
- placing a metrology probe at each of a number of successive locations on the thread, the metrology probe being adjustable using an articulating arm;
- recording a three-dimensional point of the said thread locations by a computerized metrology system coupled to the articulating arm;
- and
- using the computerized metrology system, producing data characterizing the thread as a function of the recorded three-dimensional points of the said thread locations.
A computerized thread measurement system for inspecting the thread of a threaded object, the system comprising:
- an articulating probe arm having a metrology probe;
- and
- a computerized metrology system in communication with the probe arm, the computerized metrology system configured to:
- adjust the position and orientation of the probe arm,
- record a three-dimensional point of the probe at each of a number of successive thread locations, and
- produce measurement data characterizing the thread.
Apparatus comprising a tangible, non-transitory computer-readable medium having embodied therein instructions for inspecting the thread of a threaded object, the instructions, when run on a computerized metrology system including a probe arm having a metrology probe, causing the computerized metrology system to perform the processes of:
- placing the metrology probe at each of a number of successive locations on the thread,
- recording a three-dimensional point of the probe at each of the number of successive locations;
- and
- producing measurement data characterizing the thread.
Dependencies are inferred from the claim text.