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US 2013/0096833 A1Published application
Systems and methods for the determination of formation water resistivity and conductivity
AssigneeCore Laboratories LP
InventorsRagheb R. Hanna, Ted J. Griffin, JR., Paul Roger Martin, Robert Hanna Lee, John Dacy
Life of this patent
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Abstract
According to various embodiments, a method may include measuring a first capacitance of a sample at a first frequency using a measurement system, measuring a second capacitance of the sample at a second frequency using the measurement system, calculating a ratio of the first capacitance to the second capacitance, and determining a formation water resistivity or conductivity of the sample using the ratio.
Claims20
A method comprising:
- measuring a first capacitance of a sample at a first frequency using a measurement system;
- measuring a second capacitance of the sample at a second frequency using the measurement system;
- calculating a ratio of the first capacitance to the second capacitance;
- and
- determining a formation water resistivity or conductivity of the sample using the ratio.
2 more elements
A system comprising:
- a measurement system configured to sense capacitances of a sample at two or more frequencies, determine a ratio of the capacitances, and determine a formation water resistivity or conductivity of the sample using the ratio of capacitances.
A system comprising:
- a sensor configured to be inserted into a well and configured to sense capacitances of a formation of the well at two or more frequencies;
- and
- a measurement system configured to receive the capacitances from the sensor, determine a ratio of the capacitances, and determine a formation water resistivity or conductivity of the formation of the well using the ratio of capacitances.
Dependencies are inferred from the claim text.