Methods Of Forming Circuit Structures Within Openings And Methods Of Forming Conductive Lines Across At Least A Portion Of A Substrate
AssigneeMicron Technology, Inc.
InventorsSony Varghese, Sanh D. Tang
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AssigneeMicron Technology, Inc.
InventorsSony Varghese, Sanh D. Tang
Estimating the term…
A method of forming circuit structures within openings includes forming pairs of spaced projections that project elevationally relative to a support material on opposing sides of respective openings formed into the support material. At least two of the spaced projections of different of the pairs are received between immediately adjacent of the openings. Conductive metal is formed elevationally over the projections and into and overfilling the openings. The metal is of a composition different from that of at least elevationally outermost portions of the projections. The metal is removed from being elevationally over the projections and at least some of the metal between the projections is removed. Other embodiments and aspects are disclosed.
A method of forming circuit structures within openings, comprising:
A method of forming a circuit structure within an opening, comprising:
21-28. (canceled)
A method of forming a circuit structure within an opening, comprising:
A method of forming a circuit structure within an opening, comprising:
31-33. (canceled)
A method of forming conductive lines across at least a portion of a substrate, comprising:
(canceled)
A method of forming a circuit structure within an opening, comprising:
37-38. (canceled)
A method of forming conductive lines across at least a portion of a substrate, comprising:
40-41. (canceled)
Dependencies are inferred from the claim text.