Methods for Reducing Path Loss While Testing Wireless Electronic Devices with Multiple Antennas

A method for using a test station to test a device under test that includes at least first and second antenna structures, wherein the test station includes a test enclosure and a test antenna within the test enclosure, the method comprising:

• while the device under test is mated with a test fixture within the test enclosure, positioning the device under test in a first orientation that minimizes radio-frequency signal path loss for radio-frequency signals travelling between the test antenna and the first antenna structure;
• performing radio-frequency measurements on the first antenna structure while the device under test is in the first orientation;
• while the device under test is mated with the test fixture, positioning the device under test in a second orientation that minimizes radio-frequency signal path loss for radio-frequency signals travelling between the test antenna and the second antenna structure;
• and
• performing radio-frequency measurements on the second antenna structure while the device under test is in the second orientation.

A method for using a test station to test a device under test that includes at least first and second antenna structures, wherein the test station includes a test enclosure and a near field communications element within the test enclosure, the method comprising:

• positioning the device under test in a first orientation;
• while the device under test is in the first orientation, receiving radio-frequency signals from the device under test with the near field communications element using near field electromagnetic coupling;
• positioning the device under test in a second orientation that is different from the first orientation;
• and
• while the device under test is in the second orientation, receiving radio-frequency signals from the device under test with the near field communications element using near field electromagnetic coupling.