Semiconductor device and method for manufacturing the same
AssigneeMitsubishi Electric Corporation
InventorsTakayuki HISAKA, Takahiro NAKAMOTO, Toshihiko SHIGA, Koichiro NISHIZAWA
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AssigneeMitsubishi Electric Corporation
InventorsTakayuki HISAKA, Takahiro NAKAMOTO, Toshihiko SHIGA, Koichiro NISHIZAWA
Estimating the term…
A semiconductor device includes: a semiconductor substrate; an underlying wiring on the semiconductor substrate; a resin film extending to the semiconductor substrate and the underlying wiring, and having a first opening on the underlying wiring; a first SiN film on the underlying wiring and the resin film, and having a second opening in the first opening; an upper layer wiring on the underlying wiring and part of the resin film; and a second SiN film on the upper layer wiring and the resin film, and joined to the first SiN film on the resin film. The upper layer wiring includes a Ti film, connected to the underlying wiring via the first and second openings, and an Au film on the Ti film. The first and second SiN films circumferentially protect the Ti film.
A semiconductor device comprising:
A method for manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.