Mass distribution measuring method and mass distribution measuring apparatus
AssigneeCanon Kabushiki Kaisha
InventorsMasafumi Kyogaku, Koichi Tanji
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AssigneeCanon Kabushiki Kaisha
InventorsMasafumi Kyogaku, Koichi Tanji
Estimating the term…
To provide a method that reduces an influence of dependence of an ionizing beam in an incident direction or uneven irradiation to a sample on a result of mass spectrometry, and can measure mass distribution with high reliability. A mass distribution measuring method according to the present invention includes: changing a direction of irradiating the ionizing beam to a sample surface; acquiring a plurality of mass distribution images in a plurality of incident directions; performing image transform of the mass distribution images according to an angle formed by an incident direction of the ionizing beam and a substrate surface; synthesizing the plurality of transformed images; and outputting the synthesized mass distribution images.
A mass distribution measuring method of irradiating an ionizing beam toward a sample surface on a substrate, and detecting information including a mass-to-charge ratio and a detection position of generated ions, further comprising:
A mass distribution measuring apparatus comprising:
A mass distribution measuring apparatus comprising:
An image acquiring method of acquiring a synthesized image with a reduced influence of an irregularity on a sample surface, comprising:
Dependencies are inferred from the claim text.