Continuous prediction of expected chip performance throuhout the production lifecycle

A system for predicting at least one feature of at least one product being manufactured, the system comprising:

• at least one memory device;
• and
• at least one processor,
• wherein the processor is configured to
• receive, from at least one sensor installed in at least one equipment performing one or more manufacturing process steps, at least one measurement of the at least one feature of the at least one product being manufactured;
• select one or more of the at least one received measurement of the at least one feature of the at least one product;
• estimate additional measurements of the at least one feature of the at least one product at a current manufacturing process step;
• create a computational model for predicting future measurements of the at least one feature of the at least one product, based on the selected measurement and the estimated additional measurements;
• predict the future measurements of the at least one feature of the product based on the created computational model;
• and
• output the predicted future measurements of the at least one feature of the at least one product.

A computer program product for predicting at least one feature of at least one product being manufactured, the computer program product comprising a storage medium readable by a processing circuit and storing instructions run by the processing circuit for performing a method, the method comprising:

• receiving, from at least one sensor installed in at least one equipment performing one or more manufacturing process steps, at least one measurement of the at least one feature of the at least one product being manufactured;
• selecting one or more of the at least one received measurement of the at least one feature of the at least one product;
• estimating additional measurements of the at least one product at a current manufacturing process step;
• creating a computational model for predicting future measurements of the at least one feature of the at least one product, based on the selected measurement and the estimated additional measurements;
• predicting the future measurements of the at least one feature of the at least one product based on the created computational model;
• and
• outputting the predicted future measurements of the at least one feature of the at least one product.