US 2013/0077100 A1 · SURFACE SHAPE MEASUREMENT METHOD AND SURFACE SHAPE MEASUREMENT APPARATUS

Abstract

The present surface shape measurement method includes: splitting white light that includes different wavelengths into reference light and measurement light; causing the measurement light to enter a measurement target plane; causing the reference light to enter a first diffraction grating; combining the reference light having passed through a first optical path from the first diffraction grating to enter a second diffraction grating and thereafter having passed through the first optical path from the second diffraction grating to enter the first diffraction grating to be output from the first diffraction grating and the measurement light reflected from the measurement target plane, to form interfering light, to thereby measure a surface shape of the measurement target plane.

Claims15

Dependent claims

A surface shape measurement method, comprising:

splitting white light that includes different wavelengths into reference light and measurement light;
causing the reference light to enter a first diffraction grating, to thereafter pass through a first optical path to enter a second diffraction grating, and further thereafter causing the reference light to pass through the first optical path from the second diffraction grating to enter the first diffraction grating, while causing the measurement light to enter a measurement target planed to be reflected from the measurement target plane, and combining the reference light and the measurement light to form interfering light;
detecting an interference intensity of the interfering light;
and
measuring a surface shape of the measurement target plane based on the interference intensity.

2 more elements

A surface shape measurement apparatus, comprising:

a light source that emits white light including different wavelengths;
a splitting unit that splits the white light into reference light and measurement light;
a table on which a measurement target object to which the measurement light is emitted is placed;
a first diffraction grating having a grating in a first direction formed at a first pitch, the reference light perpendicularly entering the first diffraction grating;
a second diffraction grating having a grating in the first direction formed at the first pitch, the second diffraction grating being arranged in parallel to the first diffraction grating, and the reference light having exited from the first diffraction grating entering the second diffraction grating;
a mirror that reflects the reference light having exited from the second diffraction grating such that the reference light enters the second diffraction grating;
a combining unit that combines the reference light having been reflected from the mirror and thereafter having exited from the second diffraction grating and the first diffraction grating in order and the measurement light reflected from the measurement target object, to form interfering light;
a detecting unit that detects an interference intensity of the interfering light;
and
a measuring unit that measures a surface shape of the measurement target object based on the interference intensity.

7 more elements

Dependencies are inferred from the claim text.

Surface shape measurement method and surface shape measurement apparatus

Life of this patent

Surface shape measurement method and surface shape measurement apparatus

Life of this patent

Abstract

Claims15