Systems and method for display termpreature detection
AssigneeApple Inc.
InventorsJoshua Grey Wurzel, Ahmad Al-Dahle
Life of this patent
Estimating the term…
Abstract
Disclosed embodiments relate to a display temperature detection system that can detect temperature variations in different regions of a display panel. The temperature measuring display system includes a display panel that provides graphical images. Further, the temperature measuring display system includes temperature measurement circuitry. The temperature measurement circuitry includes one or more thermal diodes, transistors, or a mesh layer useful to determine at least one temperature measurement of the display panel.
Claims26
A temperature-measuring display system, comprising:
- a display panel configured to display a graphical image;
- and
- temperature measurement circuitry, comprising:
- a mesh layer disposed in or on the display panel;
- and
- measurement circuitry configured to determine temperature values in one or more areas of the display panel based upon attributes of the mesh layer.
A method, comprising:
- determining, via circuitry of a display panel, baseline resistance values or the baseline capacitance values or a combination thereof, at a plurality of locations in a mesh layer disposed in or on the display panel;
- determining, via the circuitry, a change in resistance, a change in capacitance, or combination thereof from the baseline resistance, capacitance, or combination thereof at one or more location in the mesh layer;
- associating, via the circuitry, the change in resistance, capacitance or combination thereof with one or more temperature values;
- and
- controlling the display panel, via the circuitry, based at least in part upon the temperature values.
An electronic device, comprising:
- a display panel configured to display a graphical image;
- a processor configured to provide image data to the display panel;
- and
- temperature measurement circuitry, comprising:
- a mesh layer disposed in or on the display panel, configured to change resistance or capacitance or a combination thereof based upon temperature changes of the display panel;
- and
- measurement circuitry, configured to determine at least one of resistance values or capacitance values of the mesh layer in one or more areas of the display panel, wherein the processor is configured to determine one or more temperature values based at least in part upon the resistance values, capacitance values, or combination thereof.
Dependencies are inferred from the claim text.