Method for testing an integrated circuit
OwnerPeter Poinstingl, Christoph Knaupp +6inventors
InventorsPeter Poinstingl, Christoph Knaupp, Helmut Randoll, Ralf Kraemer, Thomas Wieja, Steffen Wirth, Stefan Doehren, Thomas Braun
Life of this patent
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Abstract
A method for testing an integrated circuit and an integrated circuit. The integrated circuit has an internal testing structure which may be accessed via an internal test access port and a control bus which is conducted to the outside via control ports, it being possible to switch over between a running mode and a test mode so that, in the test mode, the test access port is accessed via the control ports and the control bus, thus testing the integrated circuit.
Claims7
1-9. (canceled)
A method for testing an integrated circuit having an internal testing structure which may be accessed via an internal test access port and having a control bus which is conducted to an outside via control ports, the method comprising:
- switching over between a running mode and a test mode;
- and
- accessing, in the test mode, the test access port via the control ports and the control bus to test the integrated circuit;
- wherein the switching over between the running mode and the test mode is performed using a multiplexer, and a switch-over to the test mode being caused by entering a software key.
An integrated circuit having an internal testing structure which may be accessed via an internal test access port and having a control bus which is conducted to an outside via control ports, the integrated circuit being configured to switch over between a running mode and a test mode so that, in the test mode, the test access port is accessed via the control ports and the control bus, the integrated circuit including a multiplexer to switch over between the running mode and the test mode, the integrated circuit being configured to switch-over to the test mode by entry of a software key.
Dependencies are inferred from the claim text.