Characterization and correction of voltage probe, current probe and cable
AssigneeAgilent Technologies, Inc.
InventorDavid Dascher
Life of this patent
Estimating the term…
Loading patent…
AssigneeAgilent Technologies, Inc.
InventorDavid Dascher
Estimating the term…
Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.
A method for at least one of characterizing and correcting a response of a voltage probe, the method comprising:
A method for at least one of characterizing and correcting a response of a current probe, the method comprising:
A method for at least one of characterizing and correcting a response of a cable, the method comprising:
Dependencies are inferred from the claim text.