Connection device for quality testing of charge-coupled device modules
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorsHAO ZHANG, HUI LI
Life of this patent
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Abstract
A connection device for connecting charge-coupled device (CCD) modules to test apparatuses to test the CCD modules includes a connection unit and a test unit. The connection unit includes a plurality of connection pins. The unit under test is electrically connected to the connection unit and the test apparatuses. When the connection pins are in contact with the CCD modules, the CCD modules are electrically connected to the test apparatuses through the connection unit and the test unit, such that the test apparatus receives electric signals generated by the CCD modules to enable quality testing of the CCD modules.
Claims10
A connection device for connecting charge-coupled device (CCD) modules to test apparatuses to test quality of the CCD modules, comprising:
- a connection unit electrically connecting the CCD modules to the connection device, the connection unit including a plurality of connection pins;
- and
- a test unit electrically connected to the connection unit and the test apparatuses;
- wherein when the connection pins are in contact with the CCD modules, the CCD modules are electrically connected to the test apparatuses through the connection unit and the test unit, such that the test apparatuses receive electric signals generated by the CCD modules to test quality of the CCD modules.
Dependencies are inferred from the claim text.