Test apparatus
AssigneeAdvantest Corporation
InventorKenji HASHIMOTO
Life of this patent
Estimating the term…
Abstract
To detect whether energy accumulated in an inductive load section has been discharged. Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path between the power supply section and the device under test; a housing section that houses a substrate that includes at least the inductive load section; and a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.
Claims9
A test apparatus that tests a device under test, comprising:
- a power supply section that generates a power supply voltage to be supplied to the device under test;
- an inductive load section that is provided in a path between the power supply section and the device under test;
- a housing section that houses a substrate that includes at least the inductive load section;
- and
- a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.
Dependencies are inferred from the claim text.