Non-volatile random access memory test system and method
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorMING LI
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Abstract
A computer and method test a non-volatile random access memory (NVRAM) of a basic input and output system (BIOS) chip of a motherboard under a diagnostic mode and a stress mode. The computer sets parameters of the diagnostic mode and parameters of the stress mode in a basic input and output system (BIOS) chip of the motherboard. The computer initializes the diagnostic mode according to the parameters of the diagnostic mode and the stress mode according to the parameters of the stress mode. The computer tests the NVRAM of the BIOS chip under the diagnostic mode and the stress mode.
Claims18
A computer, the computer in electronic communication with a motherboard, the computer comprising:
- a storage system;
- at least one processor;
- and
- one or more programs stored in the storage system and being executable by the at least one processor, the one or more programs comprising:
- a setting module operable to set parameters of a diagnostic mode and parameters of a stress mode in a basic input and output system (BIOS) chip of the motherboard, wherein the parameters of the diagnostic mode comprises a predetermined time to finish a test under the diagnostic mode and keywords to determine if an error occurs during the test under the diagnose mode, the parameters of the stress mode comprises a predetermined number of a test under the stress mode and keywords to determine if the error occurs during the test under the stress mode;
- an initialization module operable to initialize the diagnostic mode according to the parameters of the diagnose mode, and initialize the stress mode according to the parameters of the stress mode;
- a diagnostic mode test module operable to test a non-volatile random access memory (NVRAM) of the BIOS chip under the diagnose mode;
- and
- a stress mode test module operable to test the NVRAM of the BIOS chip under the stress mode.
An NVRAM test method implemented by a computer, the computer in electronic communication with a motherboard, the method comprising:
- setting parameters of a diagnostic mode and parameters of a stress mode in a basic input and output system (BIOS) chip of the motherboard, wherein the parameters of the diagnostic mode comprises a predetermined time to finish a test under the diagnostic mode and keywords to determine if an error occurs during the test under the diagnose mode, the parameters of the stress mode comprises a predetermined number of a test under the stress mode and keywords to determine if the error occurs during the test under the stress mode;
- initializing the diagnostic mode according to the parameters of the diagnose mode, and initializing the stress mode according to the parameters of the stress mode;
- testing a non-volatile random access memory (NVRAM) of the BIOS chip under the diagnose mode;
- and
- testing the NVRAM of the BIOS chip under the stress mode.
A non-transitory computer-readable medium having stored thereon instructions that, when executed by a computer, the computer in electronic communication with a motherboard, causing the computer to perform an NVRAM test method, the method comprising:
- setting parameters of a diagnostic mode and parameters of a stress mode in a basic input and output system (BIOS) chip of the motherboard, wherein the parameters of the diagnostic mode comprises a predetermined time to finish the test under the diagnostic mode and keywords to determine if an error occurs during a test under the diagnose mode, the parameters of the stress mode comprises a predetermined number of the test under the stress mode and keywords to determine if the error occurs during the test under the stress mode;
- initializing the diagnostic mode according to the parameters of the diagnose mode, and initializing the stress mode according to the parameters of the stress mode;
- testing a non-volatile random access memory (NVRAM) of the BIOS chip under the diagnose mode;
- and
- testing the NVRAM of the BIOS chip under the stress mode.
Dependencies are inferred from the claim text.