Apparatuses and methods for analysis of samples through multiple thicknesses with beam-through assist

A method for characterizing radiation signals emitted from an unknown homogeneous sample, the method comprising:

• providing a radiation signal detector system comprising a plurality of detectors, a computer for analyzing the sample, and a sample holder, wherein the sample holder includes a plurality of containers, each sample-container apparatus has a different size from other sample-container apparatuses, such that the homogeneous sample forms different thickness when placed in different sample-container apparatuses;
• performing background signal detection for each empty sample-container apparatus and determining a background signal count rate for each empty sample-container apparatus;
• performing reference signal detection by measuring a reference source emission having at least one prominent characteristic signal to allow signal beam-through the plurality of empty sample containers and the plurality of containers with the sample;
• performing calibration signal detection by measuring a standard-sample and the reference source emission sequentially in each sample-container apparatus and determining a standard signal count rate for each sample-container apparatus;
• subtracting the background signal count rate from standard-sample signals for each container;
• performing a ratio computation of detected fraction calibrations for two different sample thicknesses;
• performing the signal detection for the unknown homogeneous sample in each sample-container apparatus;
• subtracting the background signal count rate from the unknown homogeneous sample signals for each container;
• measuring the characteristic signal count rates for the unknown-sample in each sample-container apparatus;
• verifying the characteristic signal count rates to be qualified data;
• and
• calculating the composition of the unknown homogeneous sample by comparing the characteristic signal count rates of the unknown-sample from different sample-container apparatuses using a software model.

A method for characterizing radiation signals emitted from an unknown homogeneous sample, the method comprising:

• providing a radiation signal detector system comprising a plurality of detectors, a computer for analyzing the sample, and a sample holder, wherein the sample holder includes a plurality of containers, each sample-container apparatus has a different size from other sample-container apparatuses, such that the homogeneous sample forms different thickness when placed in different sample-container apparatuses;
• performing background signal detection for each empty sample-container apparatus and determining a background signal count rate for each empty sample-container apparatus;
• performing reference signal detection by measuring a reference source emission having at least one prominent characteristic signal to allow signal beam-through the plurality of containers with the sample;
• performing calibration signal detection by measuring a standard-sample and the reference source emission sequentially in each sample-container apparatus and determining a standard signal count rate for each sample-container apparatus;
• subtracting the background signal count rate from standard-sample signals for each container;
• performing a ratio computation of detected fraction calibrations for two different sample thicknesses, wherein the ratio computation includes measuring the reference source emission signals through the sample of the first and the second thicknesses, and calculating the ratio of the signal from the thicker thickness to the thinner thickness;
• performing the signal detection for the unknown homogeneous sample in each sample-container apparatus;
• subtracting the background signal count rate from the unknown homogeneous sample signals for each container;
• measuring the characteristic signal count rates for the unknown-sample in each sample-container apparatus;
• verifying the characteristic signal count rates to be qualified data;
• and
• calculating the composition of the unknown homogeneous sample by comparing the characteristic signal count rates of the unknown-sample from different sample-container apparatuses using a software model.

A method for characterizing radiation signals emitted from an unknown homogeneous sample, the method comprising:

• providing a radiation signal detecting system comprising a plurality of detectors, a computer for analyzing the sample composition, and two sample-containers each having the same shape;
• filling the first sample-container with a first amount of the unknown homogeneous sample;
• filling the second sample-container with a second amount of the unknown homogeneous sample;
• performing background signal detection for each sample-container and determining a background signal count rate for each sample;
• performing reference source signal detection;
• performing calibration signal detection by measuring a standard sample and the reference source emission detection sequentially in each sample-container apparatus position and determining a standard signal count rate for each sample-container;
• subtracting the background signal count rate from standard sample signals for each container;
• performing a ratio computation of detected fraction calibrations for two different sample thicknesses;
• performing the signal detection for the first unknown homogeneous sample in the first sample-container and the second unknown homogeneous sample in the second sample-container;
• subtracting the background signal count rate from the first and second unknown homogeneous sample signals;
• measuring the characteristic signal count rates for the first and second unknown samples;
• verifying the characteristic signal count rates to be qualified data;
• and
• calculating the composition of the first and second unknown homogeneous samples by comparing the characteristic signal count rates of the first and second unknown samples using a software model.

A method for characterizing radiation signals emitted from an unknown homogeneous sample, the method comprising:

• providing a radiation signal detecting system comprising a plurality of detectors, a computer for analyzing the sample composition, and two sample-containers each having the same shape;
• filling the first sample-container with a first amount of the unknown homogeneous sample;
• filling the second sample-container with a second amount of the unknown homogeneous sample;
• performing background signal detection for each sample-container and determining a background signal count rate for each sample;
• performing reference source signal detection;
• performing calibration signal detection by measuring a standard sample and the reference source emission detection sequentially in each sample-container apparatus position and determining a standard signal count rate for each sample-container;
• subtracting the background signal count rate from standard sample signals for each container;
• performing a ratio computation of detected fraction calibrations for two different sample thicknesses, wherein the ratio computation includes measuring the reference source emission signals through the sample of the first and second thicknesses, and calculating the ration of the signals from the thicker thickness to the thinner thickness;
• performing the signal detection for the first unknown homogeneous sample in the first sample-container and the second unknown homogeneous sample in the second sample-container;
• subtracting the background signal count rate from the first and second unknown homogeneous sample signals;
• measuring the characteristic signal count rates for the first and second unknown samples;
• verifying the characteristic signal count rates to be qualified data;
• and
• calculating the composition of the first and second unknown homogeneous samples by comparing the characteristic signal count rates of the first and second unknown samples using a software model.

A system for identifying radiation signals emitted from an unknown homogeneous sample, comprising:

• a sample holder comprising a plurality of sample holder configurations, each sample holder configuration enabling measurement of the homogeneous sample via at least two different thicknesses;
• a detector system to detect the radiation signals from different sample thicknesses, comprising at least one detector capable of detecting radiation signals emitted from the homogeneous sample in a predetermined energy range;
• an external radiation reference source having at least one prominent characteristic signal to allow signal beam-through the sample without interfering with the radiation signal emitted by the homogeneous sample;
• a standard sample emitting radiation signals in an energy range similar to the homogeneous sample to be measured;
• and
• a software program capable of handing reading emitted signals from sample-container apparatuses, measuring a background signal, measuring an external reference signal, calibrating the standard sample, verifying and qualifying each signal peak in emitted signal spectrum from each sample-container apparatus, correcting emitted sample signal from each sample-container apparatus;
• and analyzing sample composition using a composition database;
• and a computer to process the detected signals and analyze the sample composition by comparing radiation signals at different sample thicknesses from different containers by using the software program.

A software product embedded in a computer readable medium for providing analysis in material spectra characterization, the software product comprising:

• program codes for reading the emitted signals from the homogeneous sample;
• program codes for subtracting a background signal;
• program codes for subtracting a reference source emission signal;
• program codes for matching signals emitted from a different thickness of the homogeneous sample;
• program codes for operating on signal count rates of different thicknesses of the homogeneous sample;
• program codes for calibrating a standard sample signals, including one of the three sets of codes:
• 1) codes for measuring a first reference source emission signal through one empty sample container;
• codes for measuring a second reference source emission signal through one sample container with the sample at a first thickness;
• codes for calculating the ratio of the second to the first signals for the first thickness;
• 2) codes for measuring a second reference source emission signal through one sample container with the sample at a first thickness;
• codes for measuring a third reference source emission signal through one sample container with the sample at a second thickness;
• codes for calculating the ratio of the third to the first signals for the second thickness;
• 3) codes for measuring the reference source emission signal through the sample of the first and second thickness;
• codes for calculating the ratio of the signals from the thicker thickness to the thinner thickness;
• and
• program codes for quantization of the material spectra.