Iq calibration method of test device for wireless communication system such as dvb-h system or like, device, and test device manufacturing method

Abstract

The present invention relates to an automatic calibration method of a test device for testing a wireless communication system such as a DVB-H or the like, a device, and a manufacturing method thereof, and more specifically, to a calibration method and device for providing an automatic calibration data generation function, in which the same frequency characteristic of the test device is maintained in various frequency bands and the test device is capable of generating an exact and reliable test signal. The calibration method of the present invention comprises the steps of: (a) extracting the size of a removal target signal component on the basis of a calibration signal generated from the test device; (b) extracting a change value of the size of the removal target signal component; (c) adjusting at least one calibration parameter on the basis of the change value, and transmitting an adjusted calibration parameter value to the test device, and calculating a calibration parameter value which minimizes the size of the removal target signal component, and generating the calculated value as calibration data, by repeatedly performing the steps (a) to (c).

Dependencies are inferred from the claim text.