Spacer process for on pitch contacts and related structures
AssigneeMicron Technology, Inc.
InventorsGurtej Sandhu, Mark Kiehlbauch, Steve Kramer, John Smythe
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorsGurtej Sandhu, Mark Kiehlbauch, Steve Kramer, John Smythe
Estimating the term…
Methods are disclosed, including for increasing the density of isolated features in an integrated circuit. Also disclosed are associated structures. In some embodiments, contacts are formed on pitch with other structures, such as conductive interconnects that may be formed by pitch multiplication. To form the contacts, in some embodiments, a pattern corresponding to some of the contacts is formed in a selectively definable material such as photoresist. Features in the selectively definable material are trimmed, and spacer material is blanket deposited over the features and the deposited material is then etched to leave spacers on sides of the features. The selectively definable material is removed, leaving a mask defined by the spacer material. The pattern defined by the spacer material may be transferred to a substrate, to form on pitch contacts. In some embodiments, the on pitch contacts may be used to electrically contact conductive interconnects in the substrate.
A method for semiconductor processing, comprising:
A method for semiconductor processing, comprising:
A method for semiconductor processing, comprising:
Dependencies are inferred from the claim text.