Method of manufacturing a semiconductor laser
AssigneeRenesas Electronics Corporation
InventorsKentaro TADA, Kenji ENDO, Kazuo FUKAGAI, Tetsuro OKUDA, Masahide KOBAYASHI
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AssigneeRenesas Electronics Corporation
InventorsKentaro TADA, Kenji ENDO, Kazuo FUKAGAI, Tetsuro OKUDA, Masahide KOBAYASHI
Estimating the term…
Provided is a semiconductor laser, wherein (λa−λw) >15 (nm) and Lt<25 (μm), where λw is the wavelength of light corresponding to the band gap of the active layer disposed at a position within a distance of 2 μm from one end surface in a resonator direction, λa is the wavelength of light corresponding to the band gap of the active layer disposed at a position that is spaced a distance of equal to or more than ( 3/10)L and ≦( 7/10)L from the one end surface in a resonator direction, “L” is the resonator length, and “Lt” is the length of a transition region provided between the position of the active layer with a band gap corresponding to a light wavelength of λw+2 (nm) and the position of the active layer with a band gap corresponding to a light wavelength of λa−2 (nm) in the resonator direction.
A method of manufacturing a semiconductor laser, comprising:
A method of diffusing impurities into a semiconductor layer B through a semiconductor layer A, comprising:
Dependencies are inferred from the claim text.