Plasma processing apparatus and plasma processing method
AssigneePanasonic Corporation
InventorsShogo OKITA, Hiromi Asakura, Syouzou Watanabe, Ryuzou Houchin, Hiroyuki Suzuki
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AssigneePanasonic Corporation
InventorsShogo OKITA, Hiromi Asakura, Syouzou Watanabe, Ryuzou Houchin, Hiroyuki Suzuki
Estimating the term…
A tray for a dry etching apparatus includes substrate accommodation holes penetrating a thickness direction and a substrate support portion supporting an outer peripheral edge portion of a lower surface of a substrate. An upper portion includes a tray support surface supporting a lower surface of the tray, substrate placement portions on each of which a lower surface of the substrate to be placed, and a concave portion for accommodating the substrate support portion. A dc voltage applying mechanism applies a dc voltage to an electrostatic attraction electrode. A heat conduction gas supply mechanism supplies a heat conduction gas between the substrate and substrate placement portion. During carrying of the substrate, the outer peripheral edge of the lower surface of the substrate is supported by the substrate accommodation hole. During processing of the substrate, the substrate support portion is accommodated in the concave portion.
A plasma processing apparatus, comprising:
A plasma processing method comprising:
Dependencies are inferred from the claim text.