Electronic device and method for controlling probe measurements

An electronic device, comprising:

• a storage device;
• at least one processor;
• and
• one or more modules that are stored in the storage device and are executed by the at least one processor, the one or more modules comprising instructions:
• to read preset identification data of a probe from a preset configuration file of the probe upon the condition that the preset configuration file is stored in the storage device, the probe being electronically connected to an object measuring machine that is connected with the electronic device;
• to receive user-defined identification data of the probe from an input device of the electronic device upon the condition that the preset configuration file is not stored in the storage device;
• to fit a three dimensional (3D) model of the probe according to the preset identification data or the user-defined identification data of the probe;
• to determine if the fitted 3D model matches the probe;
• to update the user-defined identification data of the probe through the input device upon the condition that the fitted 3D model does not match the probe;
• to store the user-defined identification data of the probe in a user-defined configuration file corresponding to the probe upon the condition that the fitted 3D model matches the probe, and control the probe to execute measurement according to the user-defined configuration file.

A non-transitory storage medium having stored thereon instructions that, when executed by a processor of an electronic device, causes the electronic device to perform a method for controlling probe measurement, the method comprising:

• reading preset identification data of a probe from a preset configuration file of the probe upon the condition that the preset configuration file is stored in a storage device of the electronic device, the probe being electronically connected to an object measuring machine that is connected with the electronic device;
• receiving user-defined identification data of the probe from an input device of the electronic device upon the condition that the preset configuration file is not stored in the storage device;
• fitting a three dimensional (3D) model of the probe according to the preset identification data or the user-defined identification data of the probe;
• determining if the fitted 3D model matches the probe;
• updating the user-defined identification data of the probe through the input device upon the condition that the fitted 3D model does not match the probe;
• storing the user-defined identification data of the probe in a user-defined configuration file corresponding to the probe upon the condition that the fitted 3D model matches the probe, and controlling the probe to execute measurement according to the user-defined configuration file.