Structured Light for 3D Shape Reconstruction Subject to Global Illumination
AssigneeMitsubishi Electric Research Laboratories, Inc.
InventorsAshok Veeraraghavan, Mohit Gupta, Amit Agrawal
Life of this patent
Estimating the term…
Abstract
Depth values in a scene are measured by projecting sets of patterns on the scene, wherein each set of patterns is structured with different spatial frequency using different encoding functions. Sets of images of the scene is acquired, wherein there is one image for each pattern in each set. Depth values are determining for each pixel at corresponding locations in the sets of images. The depth values of each pixel are analyzed, and the depth value is returned if the depth values at the corresponding locations are similar. Otherwise, the depth value is marked as having an error.
Claims19
A method for measuring depth values in a scene, comprising the steps of
- projecting a plurality of sets of patterns on the scene, wherein each set is encoded with a different function and different spatial frequencies, and wherein the scene is subject to global illumination effects;
- acquiring a plurality of sets of images of the scene, wherein there is one image for each pattern in each set;
- determining the depth value for each pixel at corresponding locations in the sets of images;
- analyzing the depth values of each pixel at the corresponding locations, and
- returning the depth value if the depth values at the corresponding locations are similar, and otherwise marking the depth value as an error, wherein the steps are performed in a processor.
Dependencies are inferred from the claim text.