Phase Filters for a Scanning Microscope
AssigneeLeica Microsystems CMS GmbH
InventorsHilmar GUGEL, Arnold GISKE, Marcus DYBA, Roland SEIFERT, Bernd WIDZGOWSKI
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AssigneeLeica Microsystems CMS GmbH
InventorsHilmar GUGEL, Arnold GISKE, Marcus DYBA, Roland SEIFERT, Bernd WIDZGOWSKI
Estimating the term…
The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found.
An optical device with a focusing optic that focuses a light beam in a focal plane, and with a phase filter for forming the focus of the light beam, the phase filter for forming the focus effecting a phase shift of the light beam, wherein a support is provided which is equipped with at least two phase filters, the phase filters being individually introducible into the beam path of the light beam.
A scanning microscope with a focusing optic that focuses a light beam in a focal plane, and with a phase filter for forming the focus of the light beam, the phase filter for forming the focus effecting a phase shift of the light beam, wherein a support is provided which is equipped with at least two phase filters, the phase filters being individually introducible into the beam path of the light beam.
Dependencies are inferred from the claim text.